Optical device

ABSTRACT

An optical device including (a) a substrate having an electro-optic effect; (b) an optical waveguide formed on a surface layer portion of said substrate and including an optical waveguide for performing optical modulation for light inputted to said substrate and an output optical waveguide and a monitoring optical waveguide branched from and connected to a downstream side portion of said modulating optical waveguide, said monitoring optical waveguide guiding light for monitoring optical modulation operation of said modulating optical waveguide; and (c) a reflecting portion being provided on the downstream side of said monitoring optical waveguide for reflecting light propagated along said monitoring optical waveguide, the width of a reflection face of said reflecting portion being substantially equal to the cut-out width of said monitoring optical waveguide.

This application is a divisional of Ser. No. 11/775,917 filed Jul. 11,2007, the disclosure of which is incorporated herein by reference.

BACKGROUND OF THE INVENTION

1) Field of the Invention

The present invention relates to an optical device suitable for use witha case wherein monitoring light for monitoring optical modulationoperation is fetched.

2) Description of the Related Art

In recent years, an optical modulator configuring an optical device hasbeen applied to and used in a high-speed long-haul optical communicationtransmission apparatus. The optical modulator performs opticalmodulation by applying a modulation signal voltage to an opticalwaveguide formed on a substrate. As one of optical waveguides foroptical modulation, a Mach-Zehnder (hereinafter referred to simply asMZ) type optical waveguide is known.

In the optical modulator as an optical device to which the MZ typeoptical waveguide is applied, a traveling wave electrode (electricwaveguide) for controlling the relative phase of lights propagated alongeach of arm waveguides which form the MZ type optical waveguide isformed. In particular, a modulation signal voltage is applied to eachtraveling wave electrode to control the refraction index of the armthereby to vary the optical path length difference between the two armsto achieve optical modulation.

It is to be noted that, in order to use a modulator having such aconfiguration as described above to obtain a suitable optical modulationsignal, application of an RF modulation signal having a suitable voltageto the arm waveguides and application (operation point control) of asuitable DC bias voltage for controlling the relative phase shift amountbetween the two arm waveguides are demanded. Particularly, in order tosuitably perform the latter operation point control, it is necessary toaccurately monitor the optical output signal.

To this end, generally a function for monitoring the optical outputsignal is integrated in the optical modulator. However, two kinds ofmethods are generally available as a method for monitoring such suitableoutput signal light as described above. One of the methods is atechnique (a) wherein modulated output signal light (main signal) itselfis monitored, and the other one of the methods is a technique (b)wherein output signal light is monitored indirectly, not from the mainsignal itself but from light which has some correlation to the mainsignal.

As the former technique, three methods are available; a method (a-i)wherein a tap is provided for the optical waveguide to branch andmonitor the main signal, another method (a-ii) wherein a half mirror orthe like is arranged for the main signal after outputted from an opticalsubstrate to branch and monitor the main signal, and a further method(a-iii) wherein leakage light from the main signal waveguide is pickedup.

As the latter technique two methods are available; a method (b-i)wherein light which leaks into the substrate when phase-modulated lightof the arms of the MZ optical waveguide are coupled is monitored, andanother method (b-ii) wherein a portion for coupling phase-modulatedlight of the arms of the MZ optical waveguide is formed from an MMI(Multi-Mode Interferometer) or the like and performs switching operationsuch that an output on one side is used as monitor light. In short,according to the technique, two light fluxes having substantiallyreverse phases to each other are switched by the MMI or the like so asto be outputted alternately through the two waveguides, and one of thelight fluxes is fetched as output signal light while the other one ofthe light fluxes is fetched as monitor light.

In the former technique, it is a prerequisite that the phase differenceθ=0+α between the main signal and the monitor light is substantially 0(that is, α→0) in order that the operation for applying a suitable DCbias voltage functions. Meanwhile, in the latter technique, it is aprerequisite that the main signal light (output signal light) and themonitor light have reverse phases to each other and the phase differenceθ=n+α between the main signal and the monitor light is substantially n(that is, α→0), for example, as seen in FIG. 4 in order that theoperation for applying a suitable DC bias voltage functions. In otherwords, a modulation state of the main signal light can be monitoredaccurately from the monitor light under such a phase relationship asdescribed above.

As an example, FIG. 5 is a view showing an example of a configuration ofan optical modulator 100 as an optical device to which the method (b-ii)described hereinabove is applied. The optical modulator 100 shown inFIG. 5 includes a substrate 191 on which an MZ type optical waveguide110 and an electrode 111 are formed, a light reception section 121 forreceiving monitor light, a modulation electric signal generation section123 for generating an electric signal in accordance with modulation datato be supplied to the electrode 111, a bias voltage generation section124 for generating an operation point voltage regarding a modulationelectric signal to be supplied to the electrode 111, and a controlsection 125 for controlling the operation point voltage to be generatedby the bias voltage generation section 124 in response to the monitorlight received by the light reception section 121.

The MZ type optical waveguide 110 includes an input waveguide 101 forreceiving input light, an MMI 102 connected to the input waveguide 101,two arm waveguides 103 branched at the MMI 102, another MMI 104connected to the two arm waveguides 103, and an output optical waveguide105 and a monitoring optical waveguide 106 further branched at andconnected to the MMI 104 after the two arm waveguides 103 are coupled atthe MMI 104.

Output signal light propagated along the output optical waveguide 105 isoutputted from a face opposite to that of the substrate 191 to the inputlight is inputted. Further, a reflection groove 113 is formed at thedownstream side end of the monitoring optical waveguide 106, and lightreflected on the reflection groove 113 is outputted from a side face ofthe substrate 191 different from the end face from which the outputsignal light is outputted. In particular, the light reception section121 is formed on the side face side of the substrate 191 and receivesthe light propagated through the monitoring optical waveguide 106 andreflected by the reflection groove 113 as monitor light.

Consequently, in the optical modulator 100 shown in FIG. 5, which isapplied for example an NRZ (Non Return to Zero) modulation scheme, avoltage V1-V2 in FIG. 4 can be regarded a half-wavelength voltage Vn.Then, the control section 125 feedback controls a bias voltage V3 basedon the value of the monitor light (refer to reference character B inFIG. 4) from the light reception section 121 such that a voltage V1 isapplied to the electrode 111 when the optical output signal has the highlevel but another voltage V2 is applied to the electrode 111 when theoptical output signal has the low level.

As a modulation method of an optical signal, various methods such as duobinary, DPSK (Differential Phase Shift Keying) and DQPSK (DifferentialQuadrature Phase Shift Keying) methods are available in addition to theNRZ method described above. However, in all methods, a photodiode havinga comparatively large light reception diameter is disposed as the lightreception section 121 at the substantially center of a monitor lightbeam so that the monitor light is received. Consequently, the lightamount which can be received by the light reception section 121 issecured and the allowance of the mounting position of the photodiodewith reference to the light reception amount by the photodiode ismoderated.

In particular, while the output signal light is light formed by pickingup only light within a reduced area at the center of the waveguide usingan optical fiber not shown connected to the outgoing end face of thesubstrate 191, the monitor light is received over a wide area by thelight reception section 121.

FIG. 20 is a view showing an example of a configuration of an opticalmodulator 200 as an optical device to which the method (a-ii) describedabove wherein the main signal is branched and monitored using a halfmirror or the like arranged for the signal light after it is outputtedfrom an optical substrate is applied as a method for monitoring outputsignal light.

In the optical modulator 200 shown in FIG. 20, an MZ type opticalwaveguide 210 from which the monitoring optical waveguide 106 shown inFIG. 5 is omitted is formed on a substrate 191. In particular, the MZtype optical waveguide 210 includes an input waveguide 101 for receivinginput light, an MMI 102 connected to the input waveguide 101 forbranching the input waveguide 101, two arm waveguides 103 branched atthe MMI 102, another MMI 104 connected to the two arm waveguides 103 forcoupling the two arm waveguides 103, and an output optical waveguide 105connected to the MMI 104 after the two arm waveguides 103 are coupled bythe MMI 104.

The optical modulator 200 further includes a half mirror 231 forbranching part of light propagated along the output optical waveguide105 and outputted from an outgoing end face 210 a of the substrate 191.The optical modulator 200 further includes an electrode 111, a lightreception section 121, a modulation electric signal generation section123, a bias voltage generation section 124 and a control section 125similar to those of the optical modulator 100 shown in FIG. 5. It is tobe noted that a voltage signal generation section 122 for generating avoltage signal for the electrode 111 is formed from the modulationelectric signal generation section 123 and the bias voltage generationsection 124. In FIG. 20, the light reception section 121 is disposed soas to receive one of light fluxes branched by the half mirror 231, andthe other one of the light fluxes branched by the half mirror 231 iscoupled with an optical fiber through a lens or the like not shown.

Consequently, since, in the optical modulator 200 shown in FIG. 20,light corresponding to the output signal light is fetched as the monitorlight by the light reception section 121, similarly as in the opticalmodulator 100 shown in FIG. 5, the control section 125 performs feedbackcontrol of the bias voltage of the bias voltage generation section 124based on the value of the monitor light from the light reception section121. It is to be noted that, in the optical modulator 200 shown in FIG.20, the half mirror 231 is applied in order to fetch the monitor lightby means of the light reception section 121. Therefore, in the opticalmodulator 200, it can be supposed to be more important than in theoptical modulator 100 shown in FIG. 5 to apply a photodiode having acomparatively large light reception diameter as the light receptionsection 121 in order to secure the light reception amount.

It is to be noted that techniques relating to the present invention aredisclosed, for example, in the following Patent Documents 1 to 3.

[Patent Document 1] Japanese Patent Laid-Open No. 2003-270468

[Patent Document 2] Japanese Patent Laid-Open No. HEI 11-52158

[Patent Document 3] Japanese Patent Laid-Open No. 2006-91785

However, while, in the operation point control of such an opticalmodulator 100 as described above with reference to FIG. 5 to which anoptical device is applied, a in the deviation nΠ+α in phase differencebetween the output signal light and the monitor light preferably issubstantially zero, for example, as indicated by reference character ain FIG. 6, the value α does not fully become zero. The phase deviation αis called bias shift (bias shift is hereinafter referred to sometimessimply as BS). It is to be noted that FIG. 6 is a view illustrating thebias shift a where the monitor light is fetched using the method (b-ii)described hereinabove.

While the output signal light and the monitor light are propagated alongand outputted from the output optical waveguide 105 and the monitoringoptical waveguide 106, respectively, phase variation arises from mixingbetween 0th-order mode light and first-order mode light in the processof the light propagation in the waveguides 105 and 106. The deviation inphase variation which appears with light propagated along the outputoptical waveguide 105 and the monitoring optical waveguide 106 makes acause of generation of the bias shift described above.

Further, if the amount of the bias shift described above increases, thenthe transmission quality of light degrades. In particular, the variationof the monitor signal to be utilized as a reference in the feedbackcontrol of the bias voltage is displaced from the variation of theoutput signal light. Therefore, the output signal light is controlled ata bias point deviated from an optimum point of the feedback control.

Since, in the case of the NRZ modulation method described above, the bitrate of the modulation signal handled is comparatively low, and theinfluence of the bias shift on the transmission quality is comparativelysmall. However, in such modulation methods as the duo binary, DPSK,DQPSK methods and so forth developed together with increase of the bitrate of modulation data in recent years, it is supposed that, even ifthe amount of the bias shift is very small, the influence thereof on thetransmission quality increases.

FIGS. 7( a) to 7(d) are views illustrating, as an example, phasevariation of monitor light which causes appearance of the bias shift ain the optical modulator 100 described above with reference to FIG. 5.

Components of 0th-order mode light and first-order mode light areincluded dominantly in the monitor light outputted from the side face ofthe substrate 191 after reflection by the reflection groove 113 andreceived by the light reception section 121. If the position of theoutgoing end face at which the light reflected by the reflection groove113 is outputted from the substrate 191 is placed at an X-coordinate,then the monitor light has field intensity distributions of the0th-order mode light and the first-order mode light indicated byreference characters A1 and A2 in FIG. 7( a), respectively. Further,while, as indicated by reference character B1 in FIG. 7( b), a biasshift component described above is not included in the 0th-order modelight, as indicated by reference character B2, a fixed phase variationamount component which does not rely upon the end face position isincluded in the first-order mode light.

The 0th-order mode light and the first-order mode light exhibits a lightintensity which differs depending upon the outgoing position thereof asindicated by reference characters C1 and C2 in FIG. 7( c). Also thephases of the 0th-order mode light and the first-order mode lightdiffer. The light actually outputted from the end face at the end faceposition X is light produced by interference of the 0th-order mode lightand the first-order mode light interfere with each other and has theintensity indicated by reference character C3 in FIG. 7( c).

In particular, since the intensities and phases of the 0th-order modelight and the first-order mode light differ depending upon the end faceposition X, when the first-order mode light and the 0th-order mode lightinterfere with each other, also the interference mode differs dependingupon the end face position X. Therefore, even if the first-order modelight has a fixed bias shift amount which does not rely upon the endface position X and the 0th-order mode light does not have a phasevariation amount, variation of the phase variation amount, that is, aspatial distribution, appears depending upon the end face position X asseen in FIG. 7( d).

The end face position X described above with reference to FIGS. 7( a) to7(d) can be matched with the center position of the light reception faceof the photodiode which serves as the light reception section 121. Inparticular, even if a photodiode having a comparatively large lightreception diameter is disposed, such a spatial distribution of the phasevariation amount as shown in FIG. 7( d) appears depending upon thecenter position of the light reception face for receiving the monitorlight. Therefore, the value of the phase variation amount is varied by avery small displacement of the mounting position of the photodiode,which gives rise to variation of the influence on the transmissionquality.

As described above, since a photodiode having a comparatively largelight reception diameter is applied as the light reception section 121,the light intensity necessary for monitoring can be obtained withoutperforming strict alignment of the position of the light reception faceof the photodiode. However, the light reception section 121 receivesalso light produced by interference of the 0th-order mode light, whichhas no bias shift component, from within light outputted from the endface with the first-order mode light which has a bias shift component.Therefore, such a bias shift as described above appears, and it isdifficult to grasp the bias shift amount only from the monitor light.

Since, in the output optical waveguide 105, some waveguide length issecured normally and higher-order mode light is eliminated at theoutgoing point of time, the phase variation which arises when the lightpropagated along the monitoring optical waveguide 106 described above isreceived by the light reception section 121 does not appear in theoutput signal light outputted from the output optical waveguide 105.Therefore, if the phase variation amount regarding the output signallight outputted from the output optical waveguide 105 is ignored, thenthe phase variation amount of the light propagated along the monitoringoptical waveguide 106 can be considered as it is as the bias shiftamount.

Such a bias shift as described above with reference to FIG. 4 arisesfrom a factor that light produced by interference of the 0th-order modelight and the higher-order mode light is received by the photodiode inthis manner. Further, also the fact that mixing occurs between the0th-order mode light and the higher-order mode light of the propagatedlight depending upon the bent pattern of an optical waveguide forintroducing monitoring light and shifts the phase of the 0th-order modelight itself makes a factor of appearance of a bias shift if the mixingmanners of the 0th-order mode light and the higher-order mode light aredifferent from each other.

Further, also in operation point control of such an optical modulator200 as an optical device as described hereinabove with reference to FIG.20, some component of light monitored by means of the light receptionsection 121 which receives one of light fluxes branched by the halfmirror 231 may possibly have the phase deviation α which makes a biasshift in the half-wavelength voltage Vn with respect to the output lightsignal branched by the half mirror 231 and to be coupled to an opticalfiber not shown as seen in FIG. 21 (refer to a deviation ΔV of theoperation point voltage in FIG. 21).

In particular, while, in the optical modulator 200 shown in FIG. 20,light fluxes whose phase is modulated by the arm waveguides 103 aremultiplexed by the MMI 104 and coupled to the output optical waveguide105, the modulated light includes not only the 0th-order mode light towhich original suitable modulation is applied but also the higher-ordermode light whose phase is displaced from that of the originalmodulation, for example, as shown in FIG. 22.

Generally, the output optical waveguide 105 is designed such that somedegree of length is secured to cut off higher-order mode light. However,under such various constraints on the design that the length of thesubstrate 191 is restricted for downsizing of the device and it isdemanded to secure the length of the arm waveguides 103 required forreduction of the voltage, it is difficult to implement the outputoptical waveguide 105 which fully removes higher-order mode light.Therefore, not a little higher-order mode light remains in the outputoptical waveguide 105.

Where a photodiode whose light reception area is large is applied asdescribed above as the light reception section 121 for receiving thelight in which higher-order mode light remain in this manner, itreceives not only the 0th-order mode light component but also theremaining higher-order mode light. Therefore, a bias shift similar tothat in the case described hereinabove with reference to FIGS. 7( a) to7(d) appears in the component monitored by the light reception section121.

It is to be noted that all of the techniques disclosed in PatentDocuments 1 to 3 suppress optical transmission of higher-order modelight but none of Patent Documents 1 to 3 discloses or suggests aconfiguration for suppressing the bias shift.

SUMMARY OF THE INVENTION

It is an object of the present invention to provide an optical devicecapable of suppressing a bias shift which is a deviation of a phaserelationship between output signal light and monitoring light.

(1) In order to attain the object described above, according to anaspect of the present invention, there is provided an optical devicecomprising a substrate having an electro-optic effect, a modulatingoptical waveguide formed on a surface layer portion of the substrate andforming an interference optical modulator for modulating input light,and an output optical waveguide and a monitoring optical waveguide eachformed on the surface layer portion of the substrate and branched fromand connected to a downstream side portion of the modulating opticalwaveguide, the monitoring optical waveguide guiding light for monitoringoptical modulation operation of the modulating optical waveguide, themonitoring optical waveguide having a reduced width region which has areduced waveguide width.

(2) The waveguide width of the reduced width region may be continuouslyreduced along a light propagation direction of the monitoring opticalwaveguide.

(3) The monitoring optical waveguide may have, on the downstream side ina light propagation direction with respect to the reduced width region,a width maintaining region in which the waveguide width reduced in thereduced width region is maintained.

(4) Preferably, the optical device further comprises a reflectingportion provided at a downstream side end portion of the widthmaintaining region for reflecting light propagated along the monitoringoptical waveguide, an outgoing end face of the substrate for the lightpropagated along the output optical waveguide being different from anoutgoing end face of the substrate for light reflected by the reflectingportion.

(5) Further, the width of the reflection face of the reflecting portionmay be substantially equal to the cut-out width of the monitoringoptical waveguide.

(6) Or, the reflecting portion may be a reflection groove formed on thesubstrate.

(7) The output optical waveguide may include a first bent region havinga shape bent at a predetermined bent angle from a portion connected tothe modulating optical waveguide, and the monitoring optical waveguidemay include a second bent region formed on the upstream side in thelight propagation direction with respect to the reduced width region soas to bend a region including a portion thereof connected to themodulating optical waveguide at an angle corresponding to the bent angleof the first bent region.

(8) The reduced width region may radiate higher-order mode light fromwithin the light propagated along the monitoring optical waveguide tothe outside of the monitoring optical waveguide but may cause 0th-ordermode light from within the light to propagate along the monitoringoptical waveguide on the downstream side with respect to the reducedwidth region.

(9) The reduced width region may radiate higher-order mode light fromwithin the light propagated along the monitoring optical waveguide tothe outside of the monitoring optical waveguide but may cause 0th-ordermode light from within the light to propagate along the monitoringoptical waveguide on the downstream side with respect to the reducedwidth region, and the reflecting portion may be configured so as toavoid reflection of the higher-order mode light to be radiated to theoutside of the monitoring optical waveguide but reflect the 0th-ordermode light propagated along the monitoring optical waveguide on thedownstream side with respect to the reduced width region.

(10) The modulating optical waveguide may include an input waveguide forguiding the input light and a branching and coupling waveguide connectedto the downstream side of the input waveguide for branching the inputwaveguide to a plurality of waveguides and coupling the branchedwaveguides, and the output optical waveguide and the monitoring opticalwaveguide may be branched and connected at a downstream side portion ofthe branching and coupling waveguide with respect to the coupledportion.

(11) According to another aspect of the present invention, there isprovided an optical device comprising a substrate having anelectro-optic effect, an optical waveguide formed on a surface layerportion of the substrate and including an optical waveguide forperforming optical modulation for light inputted to the substrate and anoutput optical waveguide and a monitoring optical waveguide branchedfrom and connected to a downstream side portion of the modulatingoptical waveguide, the monitoring optical waveguide guiding light formonitoring optical modulation operation of the modulating opticalwaveguide, a reflecting portion being provided on the downstream side ofthe monitoring optical waveguide for reflecting light propagated alongthe monitoring optical waveguide, the width of a reflection face of thereflecting portion being substantially equal to the cut-out width of themonitoring optical waveguide.

(12) The output optical waveguide may include a first bent region havinga shape bent at a predetermined bent angle from a portion connected tothe modulating optical waveguide, and the monitoring optical waveguidemay include a second bent region formed on the upstream side in thelight propagation direction with respect to the reflection portion so asto bend a region including a portion thereof connected to the modulatingoptical waveguide at an angle corresponding to the bent angle of thefirst bent region.

(13) The optical devices according to the configurations (1) and (11)described above may further comprise an electrode for applying anoptical modulation voltage to the light propagating along the modulatingoptical waveguide, a voltage signal generation section for generating avoltage signal to be applied to the electrode, a light reception sectionfor receiving light propagated along the monitoring optical waveguide,and a control section for controlling the voltage signal to be generatedby the voltage signal generation section based on the result of themonitoring of the light received by the light reception section.

(14) According to a further aspect of the present invention, there isprovided an optical device comprising a substrate having anelectro-optic effect, a modulating optical waveguide formed on a surfacelayer portion of the substrate and forming an interference opticalmodulator for modulating input light, an output optical waveguide formedon the surface layer portion of the substrate and connected to adownstream side portion of the modulating optical waveguide, and abranching monitoring section for monitoring branched light of lightpropagated along the output optical waveguide and emitted from anoutgoing end face of the substrate, the output waveguide having areduced width region in which the waveguide width is reduced.

(15) The output optical waveguide may have, on the downstream side in alight propagation direction with respect to the reduced width region, anincreased width region in which the waveguide width reduced in thereduced width region is increased to the original waveguide width.

(16) In the optical device having the configuration (14) describedabove, a pair of light blocking grooves for blocking the lightpropagated along regions of the substrate on the opposite sides of theoutput optical waveguide from reaching the outgoing end face may beformed in the substrate regions on the opposite sides of the outputoptical waveguide at a position on the downstream side in the lightpropagation direction with respect to the reduced width region.

(17) In the optical device having the configuration (15) describedabove, a pair of light blocking grooves for blocking the lightpropagated along regions of the substrate on the opposite sides of theoutput optical waveguide from reaching the outgoing end face may beformed in the substrate regions on the opposite sides of the outputoptical waveguide at a position on the downstream side in the lightpropagation direction with respect to the reduced width region.

(18) The modulating optical waveguide may include an input waveguide forguiding the input light and a branching and coupling waveguide connectedto the downstream side of the input waveguide for branching the inputwaveguide to a plurality of waveguides and coupling the branchedwaveguides, and the output optical waveguide may be connected to aportion of the branching and coupling waveguide on the downstream sidewith respect to the coupled portion.

(19) The optical device having the configuration (14) described abovemay further comprise an electrode for applying an optical modulationvoltage to the light propagated along the modulating optical waveguide,a voltage signal generation section for generating a voltage signal tobe applied to the electrode, and the branching monitoring sectionincluding a branching portion for branching light emitted from theoutgoing end face and a light reception portion for receiving the lightbranched by the branching section as monitoring light, a control sectionfor controlling the voltage signal to be generated by the voltage signalgeneration section based on a result of the monitoring of the lightreceived by the light reception section.

The optical devices according to the present invention are advantageousin that higher-order mode light included in monitor light can be reducedin comparison with that by the conventional technique and the bias shiftwhich is a deviation of a phase relationship between output signal lightand monitor light can be suppressed.

The above and other objects, features and advantages of the presentinvention will become apparent from the following description and theappended claims, taken in conjunction with the accompanying drawings inwhich like parts or elements are denoted by like reference characters.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a view showing an optical device according to a firstembodiment of the present invention;

FIG. 2 is an enlarged view showing part of the optical device shown inFIG. 1;

FIGS. 3( a) and 3(b) are diagrams illustrating actions of the firstembodiment of the present invention;

FIG. 4 is a diagram illustrating an example of an ideal phaserelationship between output signal light and monitor light;

FIG. 5 is a view showing a conventional optical device;

FIG. 6 is a diagram illustrating an example of a phase relationshipbetween output signal light having a bias shift a and monitor light;

FIGS. 7( a) and 7(d) are diagrams illustrating appearance of the biasshift α in the optical modulator shown in FIG. 5;

FIG. 8 is a view showing an optical device according to a modificationto the first embodiment;

FIG. 9 is a view showing an optical modulator as an optical deviceaccording to the second embodiment of the present invention;

FIGS. 10( a) to 10(d) are diagrams illustrating a reduction effect ofthe bias shift by the optical modulator shown in FIG. 9;

FIG. 11 is a diagram illustrating the variation amount of the bias shiftwith respect to the signal light wavelength according to a configurationin FIG. 20;

FIG. 12 is a view illustrating the variation amount of the bias shiftwith respect to the signal light wavelength in the configuration of theoptical modulator according to the second embodiment;

FIG. 13 is a view showing an optical modulator as an optical deviceaccording to a first modification to the second embodiment of thepresent invention;

FIG. 14 is a diagrammatic illustrating a working-effect of the opticalmodulator as the optical device according to the first modification tothe second embodiment;

FIGS. 15( a) to 15(d) are diagrams illustrating a reduction effect ofthe bias shift by the optical modulator shown in FIG. 13;

FIG. 16 is a view showing an optical modulator as an optical deviceaccording to a second modification to the second embodiment of thepresent invention;

FIG. 17 is a diagrammatic view illustrating a working-effect of theoptical modulator as the optical device according to the secondmodification to the second embodiment;

FIG. 18 is a view showing the variation amount of the bias shift withrespect to the signal light wavelength in the configuration of theoptical modulator according to the second modification to the secondembodiment;

FIG. 19 is a view showing an optical modulator as an optical deviceaccording to a third modification to the second embodiment of thepresent invention;

FIG. 20 is a view showing a conventional optical device;

FIG. 21 is a view illustrating an example of a phase relationshipbetween output signal light having a bias shift and monitor light; and

FIG. 22 is a view illustrating mixture of higher-order mode light inaddition to 0th-order mode light.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the following, preferred embodiments of the present invention aredescribed with reference to the accompanying drawings.

[a] First Embodiment

FIG. 1 is a view showing an optical device 30 according to the firstembodiment of the present invention, and FIG. 2 is an enlarged view ofpart of the optical device 30 shown in FIG. 1. Also the optical device30 of the present embodiment performs optical modulation for input lightbased on a data signal similarly as in the optical device describedhereinabove with reference to FIG. 5, and includes an optical waveguidedevice 31, a voltage signal generation section 32, a light receptionsection 33 and a control section 34 for controlling a voltage signalgenerated by the voltage signal generation section 32 based on a resultof monitoring of light received by the light reception section 33.

Here, the optical waveguide device 31 includes a substrate 91 made oflithium niobate (LiNbO3) or the like and having an opto-electric effect,and further includes an optical waveguide 10, an electrode 11 and areflection groove 13 formed on the substrate 91. The voltage signalgeneration section 32 generates a voltage signal to be applied to theelectrode 11 and includes a modulation electric signal generationsection 32 a and a bias voltage generation section 32 b similar to thoseindicated by reference numerals 123 and 124 described hereinabove withreference to FIG. 5, respectively.

The light reception section 33 receives light propagated along amonitoring optical waveguide 6 which forms the optical waveguide 10, andthe control section 34 controls the voltage signal generated by thevoltage signal generation section 32. Accordingly, the light receptionsection 33 and control section 34 are basically similar to thoseindicated by reference numerals 121 and 125 in FIG. 5 describedhereinabove, respectively.

Here, the modulation electric signal generation section 32 a supplies avoltage signal for modulating input light to the electrode 11 using amodulation scheme such as, for example, the duo binary, DPSK or DQPSKscheme. In particular, in the present embodiment, since monitor lightwherein the bias shift is suppressed in such a manner as hereinafterdescribed can be obtained, the demanded transmission quality can beimplemented also where a modulation method with which it is estimated tohave a strict allowance for the bias shift is used. In other words, thecontrol section 34 can control the bias voltage to be generated by thebias voltage generation section 32 b based on the light, whose biasshift is suppressed, received by the light reception section 33.

The optical waveguide 10 is formed on a surface layer portion of thesubstrate 91, and includes an optical waveguide 7 for optical modulationfor modulating light inputted to the substrate 91 and a monitoringoptical waveguide 6 for guiding light for monitoring optical modulationoperation of an output optical waveguide 5 and the modulating opticalwaveguide 7 which are formed by branching and connected to a downstreamside portion of the modulating optical waveguide 7.

The light modulating optical waveguide 7 is a modulating opticalwaveguide which forms an interference type optical modulator formodulating the input light and has a configuration of, for example, aMach-Zehnder type optical waveguide. In the present embodiment, thelight modulating optical waveguide 7 is a Mach-Zehnder type opticalwaveguide which has an input waveguide 1 for guiding the input lightinputted to the substrate 91, and a branching and coupling waveguide 2connected to the downstream side of the input waveguide 1 for branchingthe input waveguide 1 to a plurality of waveguides and coupling thebranched waveguides. Further, the output optical waveguide 5 andmonitoring optical waveguide 6 are divergingly connected at a portion ofthe downstream side with respect to the coupling portion of thebranching and coupling waveguide 2.

The branching and coupling waveguide 2 includes a plurality of armwaveguides (in the present embodiment, two waveguides) 2 b for guidinglight branched from the input light from the input waveguide 1, a firstconnection portion 2 a for connecting the input waveguide 1 and the armwaveguides 2 b and branching the input light from the input waveguide 1to the plural arm waveguides 2 b, and a second connection portion 2 cfor connecting the arm waveguides 2 b, output optical waveguide 5 andmonitoring optical waveguide 6 and coupling the light from the armwaveguides 2 b and then branching the coupled light to the outputoptical waveguide 5 and the monitoring optical waveguide 6.

It is to be noted that, to the first connection portion 2 a and thesecond connection portion 2 c described above, a configuration forbranching and coupling the light while maintaining a matchingrelationship in phase between the input light and output light isapplied. For example, the first and second connection portions 2 a and 2c can be formed using an MMI, a directional coupling waveguide or anoptical coupler.

Here, in the present embodiment, the monitoring optical waveguide 6includes a reduced width region 6 a wherein the waveguide width of thedownstream side the monitoring optical waveguide 6 in the lightpropagation direction is reduced with respect to that of the upstreamside. The reduced width region 6 a can be formed, for example, from atapering waveguide pattern region 6 a wherein the waveguide width iscontinuously reduced along the optical propagation direction of themonitoring optical waveguide 6. Further, in the monitoring opticalwaveguide 6, a width maintaining region 6 b in which the waveguide widthreduced in the reduced width region 6 a is maintained is included on thedownstream side in the optical propagation direction with respect to thereduced width region 6 a.

Consequently, in the reduced width region 6 a, higher-order mode lightfrom within the light propagated along the monitoring optical waveguide6 is emitted to the outside of the monitoring optical waveguide 6, but0th-order mode light can be propagated along the width maintainingregion 6 b which forms the monitoring optical waveguide 6 on thedownstream side of the reduced width region 6 a. In particular, when themonitoring light from the second connection portion 2 c passes thereduced width region 6 a described above, the 0th-order mode light isconfined in the inside of the monitoring optical waveguide 6 while thehigher-order mode light is cut off positively such that higher-ordermode light such as first-order mode light can be spatially separatedfrom the monitoring optical waveguide 6.

Particularly, as described hereinabove with reference to FIG. 5, wherethe configuration of the reduced width region 6 a is not applied andseparation of higher-order mode light is not performed positively, thebias shift value remains, for example, by approximately +/−3% as a ratioof the phase deviation within a unit period. However, where the reducedwidth region 6 a is configured such that the waveguide is tapered suchthat the width thereof decreases from 7 μm to 4 μm, the bias shift valuecan be suppressed, for example, within approximately 1% as the ratiodescribed above.

Further, the reflection groove 13 is a reflecting portion which reflectslight propagated along the width maintaining region 6 b at thedownstream side end of the width maintaining region 6 b which forms themonitoring optical waveguide 6. Consequently, the outgoing end face ofthe substrate 91 from which outgoes the monitoring light reflected bythe reflection groove 13 can be provided so as to be different from theoutgoing end face of the light propagated along the output opticalwaveguide 5.

Then, the reflection groove 13 has a reflection face corresponding tothe waveguide width of the width maintaining region 6 b. In particular,as indicated by reference character A in FIG. 2, the width of thereflection face of the reflection groove 13 is set substantially equalto the cut-off width in the light propagation direction of the widthmaintaining region 6 b which forms the monitoring optical waveguide 6.

In other words, the reflection groove 13 is formed in the followingmanner. In particular, the reflection angle and the reflection faceshape of the width maintaining region 6 b with respect to thepropagation direction of 0th-order mode light are set such thatreflection of higher-order mode light to be emitted to the outside ofthe monitoring optical waveguide 6 to the end face opposing the lightreception section 33 is avoided while the 0th-order mode lightpropagated along the width maintaining region 6 b which is themonitoring optical waveguide on the downstream side of the reduced widthregion 6 a is reflected to the end face opposing to the light receptionsection 33.

In particular, the reflection groove 13 has such a groove shape that abeam of the 0th-order mode light which makes reflection light isincluded in the light reception face of the photodiode which forms thelight reception section 33 within a width range (refer to referencecharacter A in FIG. 2) on an extension of the width maintaining region 6b but the reflection light is pointed to in a direction diverted fromthe light reception section 33 on the outside (refer to referencecharacter B in FIG. 2) of the width range A on an extension of the widthmaintaining region 6 b. As a result, higher-order mode light inputted tothe outside B of the width range A on an extension of the widthmaintaining region 6 b is diverted from the light reception face of thelight reception section 33.

Further, in the reflection groove 13 having such a configuration asdescribed above, in comparison with an alternative case wherein areflection groove having only the width range A is formed, the cut-offeffect on the higher-order mode light inputted to the light receptionsection 33 can be set substantially equal by reflection while a demandfor the accuracy required for a groove forming step is moderated.

Further, in the present embodiment, as shown in FIG. 3( b), themonitoring optical waveguide 6 includes the reduced width region 6 a.Therefore, in comparison with an alternative case wherein a monitoringoptical waveguide 6′ which does not include the reduced width region 6 ais applied [refer to reference character R1 in FIG. 3( a)], a radiationangle R2 of higher-order mode light L1 with respect to the propagationdirection of 0th-order mode light L0 can be increased, and therefore,the higher-order mode light L1 can be separated by a greater amount fromthe 0th-order mode light L0 at the stage of incoming to the reflectiongroove 13.

Accordingly, where the monitoring optical waveguide 6′ which does notinclude the reduced width region 6 a is applied, since a situation thatthe higher-order mode light L1 whose degree of separation from the0th-order mode light is comparatively low undergoes reflection towardthe reflection face of the light reception section 33 must be avoided,preferably the size C1 of the reflection face to be formed as thereflection groove 13 must be comparatively small as seen in FIG. 3( a).

On the other hand, where such a monitoring optical waveguide 6 whichincludes the reduced width region 6 a as in the present embodiment isapplied, since it is sufficient only if a situation that thehigher-order mode light whose degree of separation from the 0th-ordermode light is comparatively high undergoes reflection toward thereflection face of the light reception section 33 as shown in FIG. 3(b), the size C2 of the reflection face to be formed as the reflectiongroove 13 may be formed comparatively large. Accordingly, where theconfiguration is applied wherein the reduced width region 6 a is formed,incoming of the higher-order mode light to the light reception section33 can be eliminated with a higher degree of accuracy while a demand fordevice fabrication accuracy regarding the reflection groove 13 isreduced from that in the case shown in FIG. 3( a) so that occurrence ofa bias shift can be prevented.

In particular, for example, where the monitoring optical waveguide 6′which does not include the reduced width region 6 a is applied and thewidth of the optical waveguide 6′ is set to 7 μm, if the size C1 of thereflection face to be formed as the reflection groove 13 is set suchthat the reflection groove 13 is formed so as to be inclined by 45degrees with respect to the waveguide advancing direction and the lengthof the reflection face is set to approximately 15 μm as shown in FIG. 3(a), then the value of the bias shift can be efficiently suppressed. Onthe other hand, where the monitoring optical waveguide 6 including thereduced width region 6 is applied, even if the size C2 of the reflectionface to be formed as the reflection groove 13 is set to approximately 30μm as shown in FIG. 3( b), a sufficient suppression effect of the valueof the bias shift can be obtained.

Incidentally, as shown in FIG. 2, the output optical waveguide 5includes a first bent region 5 a having a shape bent at a predeterminedbent angle from a portion at which the output optical waveguide 5 isconnected to the modulating optical waveguide 7. Also the monitoringoptical waveguide 6 includes a second bent region 6 c having a shapebent from a portion at which the output optical waveguide 5 is connectedto the modulating optical waveguide 7. In other words, the monitoringoptical waveguide 6 in the present embodiment is composed of the secondbent region 6 c, reduced width region 5 a and width maintaining region 6b which are successively formed from a starting point provided by aconnection portion of the monitoring optical waveguide 6 from the secondconnection portion 2 c which forms the modulating optical waveguide 7.

Here, in the light introduced, for example, from an MMI which forms thesecond connection portion 2 c and propagated along the first bent region5 a of the output optical waveguide 5 and the second bent region 6 c ofthe monitoring optical waveguide 6, phase variation occurs with the0th-order mode light itself upon mixing between the 0th-order mode lightand the first-order mode light. In particular, if such mixing occursbetween the 0th-order mode light and the first-order mode light becauseof the waveguide bend at the first and second bent regions 5 a and 6 cor the like, then phase variation occurs also with the 0th-order modelight outputted from the waveguides 5 and 6.

As described above, in the process of the light propagation along thewaveguides 5 and 6, a bias shift described above appears depending uponthe deviation in phase variation of outgoing light caused by the mixingbetween the 0th-order mode light and the first-order mode light. Inother words, even if such mixing as described above occurs between the0th-order mode light and the first-order mode light in the waveguides 5and 6, only if the deviation phase variation does not occur, then arelative phase difference between the output signal light and themonitoring light does not appear, and no trouble occurs with thefeedback control by the control section 34 (refer to FIG. 1).

In particular, even if such mixing should occur, it is important tocause such mixing to occur equally in the output optical waveguide 5 andthe monitoring optical waveguide 6 so that a relative phase differenceof 0th-order mode light components outputted from the waveguides 5 and 6may not appear. In order to achieve the subject just described, thedegrees of the bend of the output optical waveguide 5 and the monitoringoptical waveguide 6 on the downstream side of the second connectionportion 2 c are set substantially equal to each other. Consequently, thephase deviation between the 0th-order mode light components outputtedfrom the output optical waveguide 5 and the monitoring optical waveguide6 can be reduced.

In particular, the second bent region 6 c of the monitoring opticalwaveguide 6 is configured such that a region on the upstream side in thelight propagation direction with respect to the reduced width region 6 aincluding the portion at which the monitoring optical waveguide 6 isconnected to the modulating optical waveguide 7 is bent at an anglecorresponding to the bent angle of the first bent region 5 a.

In the present embodiment, not only the first bent region 5 a of theoutput optical waveguide 5 and the second bent region 6 c of themonitoring optical waveguide 6 but also the region 5 b of the outputoptical waveguide 5 on the downstream side of the first bent region 5 aand the reduced width region 6 b of the monitoring optical waveguide 6are formed in a pattern so as to have a line symmetric relationship witheach other with respect to an axis of the light propagation direction.In particular, if the pattern is formed such that the regions untilafter the higher-order mode light components are substantially separatedfrom the light propagated along the output optical waveguides 5 and 6are formed in symmetrical shapes, then the manners of mixing between the0th-order mode light components and first-order mode light componentspropagated along the output optical waveguide 5 and the monitoringoptical waveguide 6 can be made substantially equal to each other.Further, if the manners of separation of the 0th-order mode light andthe first-order mode light in the reduced width regions 5 band 6 a aremade substantially equal to each other, then the phase deviation betweenthe 0th-order mode light components individually outputted from theoutput optical waveguide 5 and the monitoring optical waveguide 6 can besubstantially cancelled.

In the optical device 30 configured in such a manner as described above,input light inputted to the input waveguide 1 is phase modulated by thearm waveguides 2 b utilizing the voltage applied from the electrode 11,and the modulated light fluxes are multiplexed by the second connectionportion 2 c and then coupled to the output optical waveguide 5 and themonitoring optical waveguide 6. Where the second connection portion 2 cis formed from an MMI, modulated light fluxes having a relationship ofphases reversed to each other are outputted individually to the outputoptical waveguide 5 and the monitoring optical waveguide 6.

At this time, the modulation light fluxes to be outputted to the outputoptical waveguide 5 and the monitoring optical waveguide 6 include notonly a 0th-order mode light component to which original suitablemodulation is applied but also higher-order mode light components whosephase is deviated from that by the original modulation. There is thepossibility that 0th-order mode light and first-order mode lightincluded in the light propagated along the output optical waveguide 5and the monitoring optical waveguide 6 may act as a factor of appearanceof such a bias shift as described hereinabove.

On the other hands in the present embodiment, since the reduced widthregion 6 a for reducing the waveguide width of the monitoring opticalwaveguide 6 is included in the monitoring optical waveguide 6, receptionof higher-order mode light is eliminated and 0th-order mode light isreceived with a little loss at the point of time at which the lightpropagated along the output optical waveguide 5 is received by thephotodiode which forms the light reception section 33. Therefore, evenif there is a constraint in design on the monitoring optical waveguide 6in that the waveguide length of the monitoring optical waveguide 6 mustbe formed shorter than that of the output optical waveguide 5, and evenif high-accuracy alignment of the arranging position of the lightreception section 33, that is, the light reception face position, is notperformed, the higher-order mode light can be removed efficiently uponlight reception by the light reception section 33.

Further, where the configuration that the light propagated along themonitoring optical waveguide 6 is reflected by the reflection groove 13and the reflected light is received by the light reception section 33 isapplied, incoming of higher-order mode light to the light receptionsection 33 can be eliminated with a high degree of accuracy whilemoderating the demand for the device fabrication accuracy regarding thereflection groove 13 in comparison with that in the case wherein thereduced width region 6 a is not formed.

Further, the monitoring optical waveguide 6 includes the second bentregion 6 c which is placed on the upstream side in the light propagationdirection with respect to the reduced width region 6 a and is formed bybending the region including the place, at which the monitoring opticalwaveguide 6 is connected to the modulation waveguide 7, at an anglecorresponding to the bent angle of the first bent region 5 a. Therefore,if the manners of mixing of the 0th-order mode light components and thefirst-order mode light components propagated along the output opticalwaveguide 5 and the monitoring optical waveguide 6 are set substantiallyequal to each other and also the separation manners of the 0th-ordermode light components and the first-order mode light components in thereduced width regions 5 b and 6 a are set substantially equal to eachother, then the phase deviation between the 0th-order mode lightcomponents emitted from the output optical waveguide 5 and themonitoring optical waveguide 6 can be substantially cancelled.

In this manner, with the present embodiment, there is an advantage that,since the monitoring optical waveguide 6 includes the reduced widthregion 6 a for reducing the waveguide width of the monitoring opticalwaveguide 6, higher-order mode light components included in the light tobe received by the light reception section 33 can be reduced incomparison with those in the case according to the conventionaltechnique and the bias shift which is a deviation of a phaserelationship between output signal light and monitor light can besuppressed.

Further, the configuration is applied that the reflection groove 13 forreflecting the light propagated along the monitoring optical waveguide 6is provided on the downstream side of the monitoring optical waveguide 6and the width of the reflection face of the reflection groove 13corresponds to the waveguide width of the monitoring optical waveguide6. Therefore, there is an advantage that, since the 0th-order mode lightwhose comparatively great part is confined in and transmitted along themonitoring optical waveguide 6 is reflected positively toward the lightreception section 33 while reflection of the higher-order mode lightcomponents can be eliminated in comparison with that of the 0th-ordermode light, the higher-order mode light components included in the lightto be received by the light reception section 33 can be reduced incomparison with those in the case according to the conventionaltechnique and the bias shift which is a deviation of a phaserelationship between output signal light and monitor light can besuppressed.

Further, since not only the reduced width region 6 a but also thereflection groove 13 are formed, incoming of higher-order mode light tothe light reception section 33 can be eliminated with a higher degree ofaccuracy while moderating the demand for the device fabrication accuracyregarding the reflection groove 13 in comparison with that of the casewherein the reflection groove 13 is provided without forming the reducedwidth region 6 a.

Further, the monitoring optical waveguide 6 includes the second bentregion 6 c which is disposed on the upstream side in the lightpropagation direction with respect to the reduced width region 6 a andis formed by bending the region including the portion at which themonitoring optical waveguide 6 is connected to the modulation waveguide7 at an angle corresponding to the bent angle of the first bent region 6a. Therefore, if the mixing manners of the 0th-order mode lightcomponents and the first-order mode light components propagated alongthe output optical waveguide 5 and the monitoring optical waveguide 6are set substantially equal to each other and also the separationmanners of the 0th-order mode light components and the first-order modelight components in the reduced width regions 5 b and 6 a are setsubstantially equal to each other, then the phase deviation between the0th-order mode light components outputted from the output opticalwaveguide 5 and the monitoring optical waveguide 6 can be substantiallycancelled.

[b] Second Embodiment

FIG. 9 is a view showing an optical modulator 40 as an optical deviceaccording to a second embodiment of the present invention. Here, theoptical modulator 40 shown in FIG. 9 includes an output opticalwaveguide 42 different from that shown in FIG. 20 described above.

In particular, the optical modulator 40 according to the secondembodiment includes a substrate 91 made of LiNbO₃ or the like and havingan opto-electric effect. A modulating optical waveguide 41 which formsan interference type optical modulator for modulating input light, anoutput optical waveguide 42 connected to a portion on the downstreamside of the modulating optical waveguide 41, and a traveling waveelectrode (electric waveguide) 43 for supplying a modulation signalvoltage to light propagated along the modulating optical waveguide 41are formed on an outer layer portion of the substrate 91. Further, theoptical modulator 40 includes a half mirror 44, a light receptionsection 45, a control section 46, and a bias voltage generation section47 b and a modulation electric signal generation section 47 a which forma voltage signal generation section 47.

The modulating optical waveguide 41 includes an input light waveguide 41a for receiving input light, an MMI 41 b for branching input light fromthe input light waveguide 41 a into two light fluxes, two arm waveguides41 c for applying a relative optical path length difference to the twolight fluxes branched by the MMI 141 b using a modulation signal voltageapplied to the traveling wave electrode 43, and an MMI 41 d formultiplexing the light fluxes from the two arm waveguides 41 c.

In particular, a branching and coupling waveguide connected to thedownstream side of the input light waveguide 41 a for branching theinput light waveguide 41 a into a plurality of waveguides and couplingthe branched waveguides is formed from the MMI 41 b, arm waveguides 41 cand MMI 41 b, and the output optical waveguide 42 is connected to aportion on the downstream side of the MMI 41 d which is a couplingportion in the branching and coupling waveguide.

Further, while a modulation voltage signal to be supplied to thetraveling wave electrode 43 is generated by the modulation electricsignal generation section 47 a, a bias voltage for operation pointvoltage control for the modulation voltage signal generated by themodulation electric signal generation section 47 a is further generatedby the bias voltage generation section 47 b and is supplied to thetraveling wave electrode 43 described above. It is to be noted that themodulation electric signal generation section 47 a can generate amodulation voltage signal according to a modulation method such as, forexample, the duo binary, DPSK, DQPSK method or the like described above.

The half mirror 44 as the branching portion corresponds to the halfmirror (reference numeral 231) described hereinabove with reference toFIG. 20, and branches, as monitor light, part of light from within light(signal light in a modulated state) propagated along the output opticalwaveguide 42 and outputted from an outgoing end face 91 a of thesubstrate 91, but outputs the remaining part of the signal light as mainsignal light toward an output optical fiber or the like not shown. Alsothe light reception section 45 corresponds to the light receptionsection (reference numeral 121) shown in FIG. 20, and receives light(monitor light) branched for monitoring by the half mirror 44 andoutputs an electric signal having an amplitude in accordance with thelight amount of the received light as a result of monitoring to thecontrol section 46. Further, as the light reception section 45, aphotodiode having a comparatively wide light reception face is used.Accordingly, a branching monitoring section for monitoring the lightbranched from the light propagated along the output optical waveguide 42and outputted from the outgoing end face 91 a of the substrate 91 isformed from the half mirror 44 and the light reception section 45described above.

The control section 46 feedback controls the bias voltage in the biasvoltage generation section 47 b based on the value of the monitor light(electric signal amplitude in accordance with the light amount of themonitor light) from the light reception section 45. In other words, thevoltage signal generation section 47 for generating the voltage signalto be applied to the electrode 43 is formed from the bias voltagegeneration section 47 b and the modulation electric signal generationsection 47 a described above, and the control section 46 controls thevoltage signal to be generated by the bias voltage generation section 47b serving as a voltage signal generation section based on a result ofthe monitoring of the light received by the light reception section 45.

In the configuration of the optical modulator 200 described hereinabovewith reference to FIG. 20, not only 0th-order mode light to whichoriginal suitable modulation is applied but also higher-order mode light(for example, first-order mode light) whose phase is displaced from thatof an original modulation component are mixed in the modulated lightpropagated along the output optical waveguide 105. As described above,the higher-order mode light makes a cause of occurrence of a bias shiftupon light reception by the light reception section 121.

On the other hand, in the second embodiment, in order to separatehigher-order mode light which makes a cause of appearance of a biasshift described above from 0th-order mode light to which originalsuitable modulation is applied, a reduced width region 42 a having areduced waveguide width is provided on the output optical waveguide 42.The reduced width region 42 a is formed such that the waveguide width iscontinuously reduced along a propagation direction of the light from theMMI 41 d. Further, the waveguide length of the reduced width region 42a, that is, the region length of the continuously narrowed outputoptical waveguide 42, is sufficiently long to achieve a separationeffect of higher-order mode light.

Then, by the reduced width region 42 a included in the output opticalwaveguide 42, the higher-order mode light and the 0th-order mode lightcan be spatially separated from each other so that the higher-order modelight can be positively cut off. In particular, if the higher-order modelight is cut off in the reduced width region 42 a, then the mixtureamount of higher-order mode light in 0th-order mode light propagated ina region of the output optical waveguide 42 on the downstream side ofthe reduced width region 42 a can be reduced in comparison with that inthe case shown in FIG. 20 described above.

In particular, where the output optical waveguide whose width iscontinuously reduced is provided, even if the length of the substrate islimited and even if the length of the output optical waveguide islimited from a factor of assurance of the length of the arm waveguidesor the like, mixture of higher-order mode light can be prevented.

It is to be noted that, in FIG. 9, the output optical waveguide 42 has aconfiguration wherein light is guided obliquely with respect to theoutgoing end face 91 a in order to suppress the reflection attenuationon the outgoing end face 91 a.

Consequently, also in the monitor light received by the light receptionsection 45 through the half mirror 44, mixing of higher-order mode lightcan be reduced in comparison with that in the case of FIG. 20.Accordingly, also the bias shift amount included in the electric signalin the light reception section 45 can be reduced in comparison with thatin the case of FIG. 20.

FIGS. 10( a) to 10(d) are views illustrating a reduction effect of thebias shift by the optical modulator 40 shown in FIG. 9 in comparisonwith that (FIGS. 7( a) to 7(d)) in the case of the bias shift appearingin the case of the configuration shown in FIG. 20. As seen in FIG. 10(a), the distribution of the field intensity according to the end faceposition on the outgoing end face 91 a (refer to FIG. 9) extends alongthe direction of the axis of abscissa in comparison with that of thecase (refer to FIG. 7( a)) corresponding to the configuration in FIG. 20while the intensity is reduced.

Accordingly, as seen in FIG. 10( b), even if there is a phase variationamount component regarding the first-order mode light, the interferencebetween first-order mode light and 0th-order mode light is low incomparison with that in the conventional structure shown in FIG. 20.Further, the first-order mode light component to be received by thephotodiode as the light reception section 45 is reduced as seen in FIG.10( c). Therefore, the variation amount ΔBS1 of the bias shift accordingto the center position of the light reception face of the photodiodewhich forms the light reception section 45 can be suppressed as seen inFIG. 10( d).

FIGS. 11 and 12 are views illustrating the variation amount of the biasshift according to the center position of the light reception face ofthe photodiode which forms the light reception section. Particularly,FIG. 11 illustrates the variation amount in the configuration in FIG.20, and FIG. 12 illustrates the variation amount in the configuration ofthe optical modulator according to the second embodiment. In the opticalmodulator 40 according to second embodiment, as shown in FIG. 12, alsothe dispersion of the variation amount depending upon the signal lightwavelength can be suppressed in comparison with that of thecharacteristic (refer to FIG. 11) of the variation amount according tothe signal light wavelength regarding the configuration shown FIG. 20.

In this manner, with the optical modulator 40 as the optical deviceaccording to the second embodiment, there is an advantage that, sincehigher-order mode light and 0th-order mode light are separated from eachother by the reduced width region 42 a, the phase deviation between themonitor light and the main signal light can be suppressed.

[b1] First Modification to the Second Embodiment

FIG. 13 is a view showing an optical modulator 40A as an optical deviceaccording to a first modification to the second embodiment. As shown inFIG. 13, grooves 49A may be formed in the proximity of the oppositesides of the output optical waveguide 42 on the downstream side of thereduced width region 42 a. Thus, higher-order mode light emitted to theopposite sides of the output optical waveguide 42 is reflected by thegrooves 49A. Thus, the higher-order mode light emitted from the reducedwidth region 42 a is blocked from being outputted from the outgoing endface 91 a by the grooves 49A, and consequently, light reception by thelight reception section 45 through branching by the half mirror 44 canbe prevented further positively. As a result, it can be expected tofurther reduce the bias shift amount included in the electric signal inthe light reception section 45 in comparison with that in the case ofFIG. 9.

Accordingly, the grooves 49A described above serve as light blockinggrooves formed in substrate regions on the opposite sides of the outputoptical waveguide at the downstream side position in the lightpropagation direction with respect to the reduced width region 42 a forpreventing light (higher-order mode light) propagated in the substrateregion on the opposite sides of the output optical waveguide 42 fromcoming to the outgoing end face 91 a.

FIG. 14 is a schematic view illustrating separation of first-order modelight and prevention of outgoing on the outgoing end face 91 a in thecase wherein the reduced width region 42 a and the grooves 49A areprovided as seen in FIG. 13. As seen in FIG. 14, in the reduced widthregion 42 a of a length A1, first-order mode light from within modulatedlight from the MMI 41 d is radiated to an outer peripheral portion (notonly the outer layer portion of the substrate 91 but also in thedepthwise direction) of the output optical waveguide 42. Meanwhile,0th-order mode light is propagated in a state wherein a peak of thefield distribution is maintained on the axis of the output opticalwaveguide 42. The 0th-order mode light and first-order mode light can beseparated from each other in this manner. It is to be noted thatth-order mode light and first-order mode light are separated from eachother similarly also in the configuration in FIG. 9.

Further, since the first-order mode light radiated in the reduced widthregion to the outer peripheral portion of the output optical waveguide42 is reflected by the grooves 49A formed on the downstream side of thereduced width region 42 a as shown in FIG. 14, propagation of thefirst-order mode light to the downstream side in the light propagationdirection with respect to the position at which the grooves 49A areformed, that is, mixing of the first-order mode light into the 0th-ordermode light, is suppressed.

Further, since the separation effect of the first-order mode lightappears over the full length in the longitudinal direction of thereduced width region 42 a, it is necessary to set the formation positionof the grooves 49A to the downstream side of the reduced width region 42a. Therefore, since the separated first-order mode light is radiatedalso in the depthwise direction, the grooves 49A are formed at aposition as near as possible to the termination position of the reducedwidth region 42 a on the downstream side of the reduced width region 42a. For example, the grooves 49A are formed at a position P1 displaced bya distance C1 (=A1>C2) on the downstream side from a starting endposition of the reduced width region 42 a with respect to a position P2displaced by a distance C2 on the downstream side from the starting endposition as seen in FIG. 14.

Consequently, where the grooves 49A are formed at the position P1 neareralong the light propagation direction to the termination position of thereduced width region 42 a rather than at the position P2 spaced awayfrom the termination position of the reduced width region 42 a, theradiated light can be efficiently reflected at a comparatively shallowposition (groove depth D1 at the position P2>groove depth D2 at theposition P1). Further, it is preferable to form the grooves 49A suchthat the distance (B1) between the grooves 49A and the output opticalwaveguide 42 is reduced as much as possible to enhance the reflectioneffect of the radiated light.

FIGS. 15( a) to 15(d) are views illustrating a bias shift reductioneffect by the optical modulator 40A shown in FIG. 13. As seen from FIG.15( a), the distribution of the field strength of first-order mode lightwith respect to the end position of the outgoing end face 91 a (refer toFIG. 9) is further reduced in comparison with that in the case of theconfiguration of FIG. 9 (refer to FIG. 10( a)). Accordingly, even iffirst-order mode light has a phase variation amount component as seen inFIG. 15( b), since the first-order mode light component to be receivedby the photodiode serving as the light reception section 45 is reducedfrom that illustrated in FIG. 10( c) as seen in FIG. 15( c), thevariation amount ΔBS2 of the bias shift at the center position of thelight reception face of the photodiode serving as the light receptionsection 45 can be further suppressed in comparison with that in the caseof FIG. 10( d) as seen from FIG. 15( d).

[b2] Second Modification to the Second Embodiment

FIG. 16 is a view showing an optical modulator 40B as an optical deviceaccording to a second modification to the second embodiment. Where theconfigurations shown in FIGS. 9 and 13 are employed, since the modefield is widened, 0th-order mode light which propagates along the outputoptical waveguide 42 whose waveguide width is reduced at the reducedwidth region 42 a may possibly be radiated during propagation thereof upto the outgoing end face 91 a, resulting in occurrence of insertionloss.

Further, in the configuration of FIG. 13, while the grooves 49A formedon the opposite sides of the output optical waveguide 42 are formed soas to be positioned in the proximity of the output optical waveguide 42so that higher-order mode light may not leak to the emerging end face 91a side (refer to B1 of FIG. 14), 0th-order mode light where the modefield is expanded in this manner suffers from increase of the losscaused by reflection by the grooves 49A. On the other hand, if thegrooves 49A are formed at a position sufficiently spaced away (refer toB1 of FIG. 14) from the output optical waveguide 42 so that the losscaused by reflection of 0th-order mode light whose mode field isexpanded is reduced, then leakage of higher-order mode light increases,which gives rise to increase of the bias shift to be suppressed.

In the second modification to the second embodiment, in order to reducethe loss of 0th-order mode light, an output waveguide 42B includes anincreased width region 42 b on the downstream side with respect to thereduced width region 42 a as seen in FIGS. 16 and 17. In particular, theincreased width region 42 b increases the waveguide width reduced by thereduced width region 42 a to the original waveguide width on thedownstream side in the light propagation direction with respect to thereduced width region 42 a of the length A1.

Consequently, while higher-order mode light is radiated in the reducedwidth region 42 a, the mode field of 0th-order mode light expands.However, since the width of the mode field of the 0th-order mode lightcan be returned to the original width by the increased width region 42 bpositioned next to the reduced width region 42 a, the loss of the0th-order mode light can be reduced while the 0th-order mode light andthe higher-order mode light are separated from each other.

It is to be noted that it is necessary to set the position of thegrooves 49A in this instance to the downstream side with respect to theincreased width region 42 b in order to minimize the leakage of0th-order mode light and higher-order mode light. As describedhereinabove, first-order mode light separated by the reduced widthregion 42 a is radiated also in the depthwise direction. Accordingly,where the grooves 49A are formed at a position as near as possible tothe termination position of the increased width region 42 b on thedownstream side with respect to the increased width region 42 b (thatis, at the position P3 on the downstream side spaced by a distance C3from the starting end of the reduced width region 42 a), then radiationlight can be reflected by the shallow grooves 49A (depth D2) moreefficiently than where the grooves 49A are formed on the downstream sidewith respect to the position P3. Consequently, the substrate strengthcan be maintained regardless of formation of the grooves 49A.

Accordingly, the grooves 49A are light blocking grooves formed inregions of the substrate 91 on the opposite sides of the output opticalwaveguide 42 at a position on the downstream side in the lightpropagation direction with respect to the increased width region 42 bfor blocking light (higher-order mode light), which propagates in theregions of the substrate 91 on the opposite sides of the output opticalwaveguide 42, from coming to the outgoing end face of the substrate 91.

It is to be noted that, since the mode field of 0th-order mode light isnarrowed by the increased width region 42 b, the distance (refer to B2of FIG. 17) between the waveguide and the grooves 49A can be reduced incomparison with that in the configuration (refer to B1 of FIG. 14) ofFIG. 12 (B2<B1).

Further, in order to form the shallow grooves 49A at a position near tothe reduced width region 42 a to achieve efficient reflection ofradiation light by the grooves 49A as described above, the length A2 ofthe increased width region 42 b is set as small as possible (can be madeat least shorter than the length A1 of the reduced width region 42 a)within a range within which the loss by a variation of the mode fieldmay not be caused by sudden width increase.

Since the optical modulator 40B according to the second modification tothe second embodiment is configured in such a manner as described above,0th-order mode light and first-order mode light are separated from eachother by the reduced width region 42 a of the output waveguide 42B, andthe expanded mode field of the 0th-order mode light is returned to theoriginal one by the increased width region 42 b thereby to reduce theloss. Further, higher-order mode light separated by the reduced widthregion 42 a can be blocked from being emitted from the outgoing end face91 a as a result of reflection. Therefore, even where compared with theconfigurations described hereinabove with reference to FIGS. 9 and 13,there is an advantage that the bias shift can be further reduced and theloss of 0th-order mode light can be reduced.

FIG. 18 illustrates the variation amount of the bias shift of differentsignal light wavelengths according to the center position of the lightreception face of the photodiode serving as the light reception sectionwhere the optical modulator configuration shown in FIG. 13 is employed.In the optical modulator 40A shown in FIG. 13, also the dispersion ofthe variation amount depending upon the signal light wavelength can befurther suppressed when compared with that of the characteristic (referto FIG. 12) of the optical modulator 40 shown in FIG. 9 as seen fromFIG. 18.

Accordingly, with the optical modulator 40B according to the secondmodification to the second embodiment, since higher-order mode light and0th-order mode light are separated from each other by the reduced widthregion 42 a and the separated higher-order mode light is reflected bythe grooves 49A, there is an advantage that the phase deviation betweenmonitor light and main signal light can be further suppressed.

It is to be noted that, while the optical modulator 40B described aboveis configured such that it has the grooves 49A formed thereon, even ifit is otherwise configured such that it does not have the grooves 49Aformed thereon, for example, like an optical modulator 40C shown in FIG.19, at least 0th-order mode light and first-order mode light can beseparated from each other by the reduced width region 42 a of the outputwaveguide 42B. Therefore, the bias shift can be reduced from that of theconventional configuration shown in FIG. 20 while the loss can bereduced by returning the expanded mode field of the 0th-order mode lightto the original mode field by means of the increased width region 42 b.

[c] Others

The present invention can be carried out by modifying the embodimentsdescribed above in various manners without departing from the spirit andscope of the present invention.

In particular while the monitoring optical waveguide 6 in the firstembodiment described hereinabove includes the reduced width region 6 awhile the reflection groove 13 is formed, even if the configuration ofthe monitoring optical waveguide 6′ which does not include the reducedwidth region 6 a, for example, as seen in FIG. 3( a) or 8 is employed,it is possible to positively reflect 0th-order mode light, whosecomponent which is confined in and transmitted along the monitoringoptical waveguide 6′ is reflected by a comparatively great amount,toward the light reception section 33 but exclude the reflection ofhigher-order mode light by a greater amount than that of the 0th-ordermode light by employing the configuration that the width of thereflecting face of the reflection groove 13 corresponds to the waveguidewidth of the monitoring optical waveguide 6′. Therefore, the bias shiftcan be suppressed by a greater amount than that of the prior art. Inparticular, for example, where the monitoring optical waveguide 6′ whichdoes not have the reduced width region 6 a is used and the width thereofis set to 7 μm, if the size C1 of the reflecting face to be formed onthe reflection groove 13 is set so as to have a length of approximately15 μm while the reflection groove 13 is formed in an inclinedrelationship by 45 degrees with respect to the waveguide advancingdirection. Or, it is possible to form the monitoring optical waveguide6′ in such a shape that a beam of reflected light is included in thelight receiving face of the photodiode which forms the light receptionsection 33 within the width range (refer to A in the case of FIG. 2)while, on the outer side (refer to B in the case of FIG. 2) of the widthrange A of the monitoring optical waveguide 6′, the reflected light isdirected in a direction diverted from the light reception section 33.Further, also where the monitoring optical waveguide 6′ which does notinclude the reduced width region 6 a is employed, in order to prevent abias shift from being caused by a deviation of the phase variation ofoutgoing light which arises from mixing of the 0th-order light andfirst-order light in the process of light propagation along thewaveguides 5 and 6′, it is important to configure a bent region 6 c ofthe monitoring optical waveguide 6 such that a region including aportion of the bent region 6 c connected to the modulating opticalwaveguide 7 on the upstream side in the light propagation direction withrespect to the reflection groove 13 is bent at an angle corresponding tothe bent angle of the bent region 5 a.

In particular, the output optical waveguide 5 is configured such that,as seen in FIG. 8, it includes the first bent region 5 a having a shapein which it is bent at a predetermined bent angle from a portion atwhich the output optical waveguide 5 is connected to the modulatingwaveguide 7 and the monitoring optical waveguide 6′ is configured suchthat it includes the second bent region 6 c by which the regionincluding the portion at which the monitoring optical waveguide 6′ isconnected to the modulating waveguide 7 is bent at an anglecorresponding to the bent angle of the bent region 5 a on the upstreamside in the light propagation direction with respect to the reflectiongroove 13.

Further, while, in the embodiments described hereinabove, the pattern ofthe bent region 5 a of the output optical waveguide 5 and the secondbent region of the monitoring optical waveguide 6 is formed such thatthey may be line-symmetrical with respect to the axis in the lightpropagation direction, according to the present invention, the waveguidepattern is not limited to such a line-symmetrical waveguide pattern asdescribed above only if mixing conditions between 0th-order mode lightcomponents and first-order mode light components of light propagatingalong the output optical waveguides 5 and 6 are substantially equal toeach other.

Further, in the first embodiment described hereinabove, the arrangementposition of the photodiode serving as the light reception section 33 isnot limited particularly, but the photodiode may be disposed in contactwith a side face of the substrate 91 or in a spaced relationship from aside face of the substrate 91.

Further, the devices of the present invention can be fabricated based onthe disclosure of the embodiments described hereinabove.

1. An optical device, comprising: a substrate having an electro-opticeffect; an optical waveguide formed on a surface layer portion of saidsubstrate and including a modulating optical waveguide for performingoptical modulation for light inputted to said substrate and an outputoptical waveguide and a monitoring optical waveguide branched from andconnected to a downstream side portion of said modulating opticalwaveguide, said monitoring optical waveguide guiding light formonitoring optical modulation operation of said modulating opticalwaveguide; and a reflecting groove provided on the downstream side ofsaid monitoring optical waveguide, the reflecting groove including afirst portion that reflects light propagated along said monitoringoptical waveguide to a target, the width of a reflection face of saidfirst portion being substantially equal to the cut-out width of saidmonitoring optical waveguide, and two second portions that are disposedon both sides of said first portion with respect to a light guidingdirection of said monitoring optical waveguide, each of the secondportions reflecting light propagated along said monitoring opticalwaveguide in a direction that results in light reflected by one of thetwo second portions being diverted from the target.
 2. The opticaldevice as claimed in claim 1, wherein said output optical waveguideincludes a first bent region having a shape bent at a predetermined bentangle from a portion connected to said modulating optical waveguide; andsaid monitoring optical waveguide includes a second bent region formedon the upstream side in the light propagation direction with respect tosaid reflection portion so as to bend a region including a portionthereof connected to said modulating optical waveguide at an anglecorresponding to the bent angle of said first bent region.
 3. Theoptical device as claimed in claim 1, further comprising: an electrodefor applying an optical modulation voltage to the light propagatingalong said modulating optical waveguide; a voltage signal generationsection for generating a voltage signal to be applied to said electrode;a light reception section for receiving light propagated along saidmonitoring optical waveguide; and a control section for controlling thevoltage signal to be generated by said voltage signal generation sectionbased on the result of the monitoring of the light received by saidlight reception section.